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Abstract Crop phenology regulates seasonal carbon and water fluxes between croplands and the atmosphere and provides essential information for monitoring and predicting crop growth dynamics and productivity. However, under rapid climate change and more frequent extreme events, future changes in crop phenological shifts have not been well investigated and fully considered in earth system modeling and regional climate assessments. Here, we propose an innovative approach combining remote sensing imagery and machine learning (ML) with climate and survey data to predict future crop phenological shifts across the US corn and soybean systems. Specifically, our projected findings demonstrate distinct acceleration patterns—under the RCP 4.5/RCP 8.5 scenarios, corn planting, silking, maturity, and harvesting stages would significantly advance by 0.94/1.66, 1.13/2.45, 0.89/2.68, and 1.04/2.16 days/decade during 2021–2099, respectively. Soybeans exhibit more muted responses with phenological stages showing relatively smaller negative trends (0.59, 1.08, 0.07, and 0.64 days/decade under the RCP 4.5 vs. 1.24, 1.53, 0.92, and 1.04 days/decade under the RCP 8.5). These spatially explicit projections illustrate how crop phenology would respond to future climate change, highlighting widespread and progressively earlier phenological timing. Based on these findings, we call for a specific effort to quantify the cascading effects of future phenology shifts on crop yield and carbon, water, and energy balances and, accordingly, craft targeted adaptive strategies. 

Materials functionalities may be associated with atomic-level structural dynamics occurring on the millisecond timescale. However, the capability of electron microscopy to image structures with high spatial resolution and millisecond temporal resolution is often limited by poor signal-to-noise ratios. With an unsupervised deep denoising framework, we observed metal nanoparticle surfaces (platinum nanoparticles on cerium oxide) in a gas environment with time resolutions down to 10 milliseconds at a moderate electron dose. On this timescale, many nanoparticle surfaces continuously transition between ordered and disordered configurations. Stress fields can penetrate below the surface, leading to defect formation and destabilization, thus making the nanoparticle fluxional. Combining this unsupervised denoiser with in situ electron microscopy greatly improves spatiotemporal characterization, opening a new window for the exploration of atomic-level structural dynamics in materials.